"X-Tolerant Logic BIST for Automotive Designs using Observation Scan ..."

Ashrith S. Harith et al. (2024)

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DOI: 10.1109/VLSID60093.2024.00127

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-08

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Ashrith S. Harith, Yingdi Liu, Nilanjan Mukherjee, Jeffrey Mayer:
X-Tolerant Logic BIST for Automotive Designs using Observation Scan Technology. VLSID 2024: 718-723

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