"Measurement and Analysis of Parasitic Capacitance in FinFETs with High-k ..."

Abhisek Dixit et al. (2009)

> Home

Details and statistics

DOI: 10.1109/VLSI.DESIGN.2009.80

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

- view
  authority control:
- export record
  dblp key:
  - conf/vlsid/DixitBCMJ09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsid/DixitBCMJ09
Abhisek Dixit, Anirban Bandhyopadhyay, Nadine Collaert, Kristin De Meyer, Malgorzata Jurczak:
Measurement and Analysis of Parasitic Capacitance in FinFETs with High-k Dielectrics and Metal-Gate Stack. VLSI Design 2009: 253-258

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.