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"Identification of Correlated Device Model Parameter Values for Worst-Case ..."

Abhijit Dharchoudhury, S. M. Kang (1992)

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DOI: 10.1109/ICVD.1992.658079

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Abhijit Dharchoudhury, S. M. Kang:
Identification of Correlated Device Model Parameter Values for Worst-Case Circuit Performance Analysis. VLSI Design 1992: 339-340

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