"Hazard-Aware Directed Transition Fault ATPG for Effective Critical Path Test."

V. R. Devanathan, Ishaan Santhosh Shah (2011)

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DOI: 10.1109/VLSID.2011.42

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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V. R. Devanathan, Ishaan Santhosh Shah:
Hazard-Aware Directed Transition Fault ATPG for Effective Critical Path Test. VLSI Design 2011: 262-267

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