"Test Pattern Generation Using Modulation by Haar Wavelets and Correlation ..."

Suresh Kumar Devanathan, Michael L. Bushnell (2007)

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DOI: 10.1109/VLSID.2007.155

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Suresh Kumar Devanathan, Michael L. Bushnell:
Test Pattern Generation Using Modulation by Haar Wavelets and Correlation for Sequential BIST. VLSI Design 2007: 485-491

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