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"Effects of Technology and Dimensional Scaling on Input Loss Prediction of ..."
Tejasvi Das et al. (2005)
- Tejasvi Das, Clyde Washburn, P. R. Mukund, Steve Howard, Ken Paradis, Jung-Geau Jang, Jan Kolnik, Jeff Burleson:
Effects of Technology and Dimensional Scaling on Input Loss Prediction of RF MOSFETs. VLSI Design 2005: 295-300
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