"Design for high-speed testability of stuck-at faults."

Tapan J. Chakraborty, Vishwani D. Agrawal (1996)

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DOI: 10.1109/ICVD.1996.489454

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Tapan J. Chakraborty, Vishwani D. Agrawal:
Design for high-speed testability of stuck-at faults. VLSI Design 1996: 53-56

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