"Resource-Constrained Compaction of Sequential Circuit Test Sets."

Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy (2000)

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DOI: 10.1109/ICVD.2000.812640

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy:
Resource-Constrained Compaction of Sequential Circuit Test Sets. VLSI Design 2000: 398-405

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