"Testing Nanometer Digital Integration Circuits: Myths, Reality and the ..."

R. D. (Shawn) Blanton, Subhasish Mitra (2005)

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DOI: 10.1109/ICVD.2005.162

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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R. D. (Shawn) Blanton, Subhasish Mitra:
Testing Nanometer Digital Integration Circuits: Myths, Reality and the Road Ahead. VLSI Design 2005: 8-9

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