"Observability Register Architecture For Efficient Production Test And ..."

Dilip K. Bhavsar, Rishan Tan (2001)

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DOI: 10.1109/ICVD.2001.902689

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Dilip K. Bhavsar, Rishan Tan:
Observability Register Architecture For Efficient Production Test And Debug Of Vlsi Circuits. VLSI Design 2001: 385-390

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