"Partial scan design for technology mapped circuits."

Arun Balakrishnan, Srimat T. Chakradhar (1995)

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DOI: 10.1109/ICVD.1995.512125

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Arun Balakrishnan, Srimat T. Chakradhar:
Partial scan design for technology mapped circuits. VLSI Design 1995: 283-287

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