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"Impact of Technology Scaling on Metastability Performance of CMOS ..."

Maryam Shojaei Baghini, Madhav P. Desai (2002)

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DOI: 10.1109/ASPDAC.2002.994941

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-14

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/vlsid/BaghiniD02
Maryam Shojaei Baghini, Madhav P. Desai:
Impact of Technology Scaling on Metastability Performance of CMOS Synchronizing Latches. ASP-DAC/VLSI Design 2002: 317-

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