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"Highly reliable TaOx ReRAM with centralized filament for 28-nm embedded ..."

Yukio Hayakawa et al. (2015)

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DOI: 10.1109/VLSIC.2015.7231381

access: closed

type: Conference or Workshop Paper

metadata version: 2022-03-16

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  - conf/vlsic/HayakawaHYBVVWC15
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Yukio Hayakawa, Atsushi Himeno, Ryutaro Yasuhara, W. Boullart, E. Vecchio, T. Vandeweyer, T. Witters, D. Crotti, M. Jurczak, S. Fujii, S. Ito, Y. Kawashima, Yuuichirou Ikeda, Akifumi Kawahara, Ken Kawai, Zhiqiang Wei, Shunsaku Muraoka, Kazuhiko Shimakawa, Takumi Mikawa, Shinichi Yoneda:
Highly reliable TaOx ReRAM with centralized filament for 28-nm embedded application. VLSIC 2015: 14-

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