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"Thermal-aware test scheduling for NOC-based 3D integrated circuits."

Dong Xiang et al. (2013)

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DOI: 10.1109/VLSI-SOC.2013.6673257

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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  - conf/vlsi/XiangLCF13
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Dong Xiang, Gang Liu, Krishnendu Chakrabarty, Hideo Fujiwara:
Thermal-aware test scheduling for NOC-based 3D integrated circuits. VLSI-SoC 2013: 96-101

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