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ORCID"Impact of Gate Leakage on Efficiency of Circuit Block Switch-Off Schemes."
Stephan Henzler et al. (2003)
- Stephan Henzler, Philip Teichmann, Markus Koban, Jörg Berthold, Georg Georgakos, Doris Schmitt-Landsiedel:
Impact of Gate Leakage on Efficiency of Circuit Block Switch-Off Schemes. VLSI-SoC (Selected Papers) 2003: 229-245
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