"Process Variability Impact on the SET Response of FinFET Multi-level Design."

Leonardo Heitich Brendler et al. (2019)

Details and statistics

DOI: 10.1007/978-3-030-53273-4_5

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

a service of  Schloss Dagstuhl - Leibniz Center for Informatics