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"New techniques for selecting test frequencies for linear analog circuits."

Mohand Bentobache et al. (2013)

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DOI: 10.1109/VLSI-SOC.2013.6673256

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-05

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  - conf/vlsi/BentobacheBEKM13
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Mohand Bentobache, Ahcène Bounceur, Reinhardt Euler, Yann Kieffer, Salvador Mir:
New techniques for selecting test frequencies for linear analog circuits. VLSI-SoC 2013: 90-95

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