"New scan-based attack using only the test mode."

Sk Subidh Ali et al. (2013)

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DOI: 10.1109/VLSI-SOC.2013.6673281

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Sk Subidh Ali, Ozgur Sinanoglu, Samah Mohamed Saeed, Ramesh Karri:
New scan-based attack using only the test mode. VLSI-SoC 2013: 234-239

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