"Hold violation analysis for functional test of ultra-low temperature ..."

Takahiro Nakayama, Masanori Hashimoto (2018)

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DOI: 10.1109/VLSI-DAT.2018.8373263

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type: Conference or Workshop Paper

metadata version: 2022-01-03

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Takahiro Nakayama, Masanori Hashimoto:
Hold violation analysis for functional test of ultra-low temperature circuits at room temperature. VLSI-DAT 2018: 1-4

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