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"Efficient test length reduction techniques for interposer-based 2.5D ICs."
Shyue-Kung Lu et al. (2014)
- Shyue-Kung Lu, Huai-Min Li, Masaki Hashizume, Jin-Hua Hong, Zheng-Ru Tsai:
Efficient test length reduction techniques for interposer-based 2.5D ICs. VLSI-DAT 2014: 1-4
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