Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Efficient test length reduction techniques for interposer-based 2.5D ICs."

Shyue-Kung Lu et al. (2014)

> Home

Details and statistics

DOI: 10.1109/VLSI-DAT.2014.6834878

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/vlsi-dat/LuLHHT14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsi-dat/LuLHHT14
Shyue-Kung Lu, Huai-Min Li, Masaki Hashizume, Jin-Hua Hong, Zheng-Ru Tsai:
Efficient test length reduction techniques for interposer-based 2.5D ICs. VLSI-DAT 2014: 1-4

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.