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"2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT ..."
- 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017. IEEE 2017, ISBN 978-1-5090-3969-2 [contents]
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