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"An effective test methodology enabling detection of weak bits in SRAMs: ..."
Nidhi Batra et al. (2016)
- Nidhi Batra, Anil Kumar Gundu, Mohammad S. Hashmi
, G. S. Visweswaran, Anuj Grover:
An effective test methodology enabling detection of weak bits in SRAMs: Case study in 28nm FDSOI. VDAT 2016: 1-6
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