"VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, ..."

Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh (2017)

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DOI: 10.1007/978-981-10-7470-7

access: closed

type: Editorship

metadata version: 2018-01-06

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Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh:
VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers. Communications in Computer and Information Science 711, Springer 2017, ISBN 978-981-10-7469-1 [contents]

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