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"Development of a High Resolution Topography and Color Scanner to Capture ..."

Mathijs J. W. van Hengstum et al. (2018)

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DOI: 10.2312/GCH.20181336

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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  dblp key:
  - conf/vast/HengstumEEDSGD18
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  - https://dblp.org/rec/conf/vast/HengstumEEDSGD18
Mathijs J. W. van Hengstum, Tessa T. W. Essers, Willemijn S. Elkhuizen, Dimitra Dodou, Yu Song, Jo M. P. Geraedts, Joris Dik:
Development of a High Resolution Topography and Color Scanner to Capture Crack Patterns of Paintings. GCH 2018: 11-20

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