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"Research and Development of Intelligent Tests and a Process Design System ..."

Ling Chen et al. (2022)

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DOI: 10.1109/UV56588.2022.10185477

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-08

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  dblp key:
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Ling Chen, Yaman Wang, Yuchen Long, Zengfeng Duan, Yanyan Li:
Research and Development of Intelligent Tests and a Process Design System for Complex and Precision Parts of Electronic Products. UV 2022: 1-7

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