"Randomness-efficient low degree tests and short PCPs via epsilon-biased sets."

Eli Ben-Sasson et al. (2003)

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DOI: 10.1145/780542.780631

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-14

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Eli Ben-Sasson, Madhu Sudan, Salil P. Vadhan, Avi Wigderson:
Randomness-efficient low degree tests and short PCPs via epsilon-biased sets. STOC 2003: 612-621

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