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"Improved Low-Degree Testing and its Applications."

Sanjeev Arora, Madhu Sudan (1997)

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DOI: 10.1145/258533.258642

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-14

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  dblp key:
  - conf/stoc/AroraS97
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  - https://dblp.org/rec/conf/stoc/AroraS97
Sanjeev Arora, Madhu Sudan:
Improved Low-Degree Testing and its Applications. STOC 1997: 485-495

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