"Measuring Overfitting in Convolutional Neural Networks using Adversarial ..."

Svetlana Pavlitskaya, Joël Oswald, J. Marius Zöllner (2022)

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DOI: 10.1109/SSCI51031.2022.10022094

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type: Conference or Workshop Paper

metadata version: 2023-02-08

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Svetlana Pavlitskaya, Joël Oswald, J. Marius Zöllner:
Measuring Overfitting in Convolutional Neural Networks using Adversarial Perturbations and Label Noise. SSCI 2022: 1551-1559

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