"Automatic Integration Test Generation from Unit Tests of eXVantage Product ..."

J. Jenny Li, David M. Weiss, J. Hamilton Slye (2007)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2021-01-14

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J. Jenny Li, David M. Weiss, J. Hamilton Slye:
Automatic Integration Test Generation from Unit Tests of eXVantage Product Family. SPLC (2) 2007: 73-80

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