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"Automated surface defect inspection system for capacitive touch sensor."

Yu-Min Chiang, Yih-Lon Lin, Wei-Hong Chien (2015)

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DOI: 10.1109/SOCPAR.2015.7492820

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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  - conf/socpar/ChiangLC15
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Yu-Min Chiang, Yih-Lon Lin, Wei-Hong Chien:
Automated surface defect inspection system for capacitive touch sensor. SoCPaR 2015: 274-277

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