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"Enhanced IEEE 1500 test wrapper for testing small RAMs in SOCs."

Yu-Jen Huang, Yun-Chao You, Jin-Fu Li (2010)

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DOI: 10.1109/SOCC.2010.5784742

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-17

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Yu-Jen Huang, Yun-Chao You, Jin-Fu Li:
Enhanced IEEE 1500 test wrapper for testing small RAMs in SOCs. SoCC 2010: 236-240

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