"A novel intelligent approach to anchorage measurement using electron ..."

Karol Warne et al. (2003)

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DOI: 10.1109/ICSMC.2003.1244482

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Karol Warne, Girijesh Prasad, Nazmul H. Siddique, Liam P. Maguire:
A novel intelligent approach to anchorage measurement using electron microscopy. SMC 2003: 3810-3815

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