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"A Robust Completed Local Binary Pattern (RCLBP) for Surface Defect Detection."

Nana Kankam Gyimah et al. (2021)

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DOI: 10.1109/SMC52423.2021.9659140

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-11

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  dblp key:
  - conf/smc/GyimahGMNHO21
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  - https://dblp.org/rec/conf/smc/GyimahGMNHO21
Nana Kankam Gyimah, Abenezer Girma, Mahmoud Nabil Mahmoud, Shamila Nateghi, Abdollah Homaifar, Daniel Opoku:
A Robust Completed Local Binary Pattern (RCLBP) for Surface Defect Detection. SMC 2021: 1927-1934

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