BibTeX record conf/smc/EndoTKN08

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@inproceedings{DBLP:conf/smc/EndoTKN08,
  author    = {Maki Endo and
               Kosuke Tsuruta and
               Soichiro Kita and
               Hiroshi Nakajima},
  title     = {A study of cause-effect structure acquisition for anomaly diagnosis
               in discrete manufacturing processes},
  booktitle = {Proceedings of the {IEEE} International Conference on Systems, Man
               and Cybernetics, Singapore, 12-15 October 2008},
  pages     = {2099--2104},
  publisher = {{IEEE}},
  year      = {2008},
  url       = {https://doi.org/10.1109/ICSMC.2008.4811601},
  doi       = {10.1109/ICSMC.2008.4811601},
  timestamp = {Wed, 16 Oct 2019 14:14:51 +0200},
  biburl    = {https://dblp.org/rec/conf/smc/EndoTKN08.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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