"Modeling the Dependencies between Circuit and Technology Parameters for ..."

Elena-Diana Sandru et al. (2019)

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DOI: 10.1109/SMACD.2019.8795266

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-03

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Elena-Diana Sandru, Corneliu Burileanu, Emilian David, Andi Buzo, Georg Pelz:
Modeling the Dependencies between Circuit and Technology Parameters for Sensitivity Analysis using Machine Learning Techniques. SMACD 2019: 237-240

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