"Fourier analysis-based automatic test pattern generation for combinational ..."

Tolga Ayav (2015)

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DOI: 10.1109/SIU.2015.7129939

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-27

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Tolga Ayav:
Fourier analysis-based automatic test pattern generation for combinational circuits. SIU 2015: 128-131

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