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"Measuring and Mitigating Speckle Noise in Dual-Axis Confocal Microscopy ..."

Davit Gigilashvili et al. (2018)

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DOI: 10.1109/SITIS.2018.00050

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-08

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Davit Gigilashvili, Chengbo Yin, Jonathan T. C. Liu, Jon Yngve Hardeberg, Marius Pedersen:
Measuring and Mitigating Speckle Noise in Dual-Axis Confocal Microscopy Images. SITIS 2018: 281-288

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