"Low cost ECC schemes for improving the reliability of DRAM+PRAMMAIN memory ..."

Manqing Mao et al. (2014)

Details and statistics

DOI: 10.1109/SIPS.2014.6986076

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

a service of  Schloss Dagstuhl - Leibniz Center for Informatics