Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Signal processing techniques for reliability improvement of sub-20NM NAND ..."

Dong-hwan Lee, Jonghong Kim, Wonyong Sung (2013)

> Home

Details and statistics

DOI: 10.1109/SIPS.2013.6674526

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/sips/LeeKS13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/sips/LeeKS13
Dong-hwan Lee, Jonghong Kim, Wonyong Sung:
Signal processing techniques for reliability improvement of sub-20NM NAND flash memory. SiPS 2013: 318-323

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.