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"Better test cases for better automated program repair."

Jinqiu Yang et al. (2017)

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DOI: 10.1145/3106237.3106274

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-23

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  dblp key:
  - conf/sigsoft/YangZLT17
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Jinqiu Yang, Alexey Zhikhartsev, Yuefei Liu, Lin Tan:
Better test cases for better automated program repair. ESEC/SIGSOFT FSE 2017: 831-841

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