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"JITO: a tool for just-in-time defect identification and localization."

Fangcheng Qiu et al. (2020)

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DOI: 10.1145/3368089.3417927

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  dblp key:
  - conf/sigsoft/QiuY0WFH020
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  - https://dblp.org/rec/conf/sigsoft/QiuY0WFH020
Fangcheng Qiu, Meng Yan, Xin Xia, Xinyu Wang, Yuanrui Fan, Ahmed E. Hassan, David Lo:
JITO: a tool for just-in-time defect identification and localization. ESEC/SIGSOFT FSE 2020: 1586-1590

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