"Abstracts of the 2025 ACM SIGMETRICS International Conference on ..."

Anshul Gandhi et al. (2025)

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DOI: 10.1145/3726854

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type: Editorship

metadata version: 2025-06-06

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Anshul Gandhi, Zhenhua Liu, Sewoong Oh, Ramesh K. Sitaraman, Benny Van Houdt:
Abstracts of the 2025 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS 2025, Stony Brook, NY, USA, June 9-13, 2025. ACM 2025, ISBN 979-8-4007-1593-8 [contents]

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