"Deep Just-In-Time Defect Prediction Based on Double-Source Input ..."

Weixiang Hong et al. (2024)

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DOI: 10.18293/SEKE2024-115

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type: Conference or Workshop Paper

metadata version: 2025-05-31

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Weixiang Hong, Yi Wu, Hui Li, Shikai Guo:
Deep Just-In-Time Defect Prediction Based on Double-Source Input Self-Attention Mechanism (S). SEKE 2024: 183-188

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