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"Lattice Metric Space Application to Grain Defect Detection."

Yuchen He, Sung Ha Kang (2019)

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DOI: 10.1007/978-3-030-22368-7_30

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-28

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  dblp key:
  - conf/scalespace/HeK19
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Yuchen He, Sung Ha Kang:
Lattice Metric Space Application to Grain Defect Detection. SSVM 2019: 381-392

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