"Successful prototyping of complex integrated circuits with focused ion beam."

E. Petitprez et al. (2016)

Details and statistics

DOI: 10.1109/SBCCI.2016.7724072

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-12

a service of  Schloss Dagstuhl - Leibniz Center for Informatics