"Reliability aware yield improvement technique for nanotechnology based ..."

Costas Argyrides et al. (2009)

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DOI: 10.1145/1601896.1601958

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/sbcci/ArgyridesDPLC09
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Costas Argyrides, Giorgos Dimosthenous, Dhiraj K. Pradhan, Carlos Arthur Lang Lisbôa, Luigi Carro:
Reliability aware yield improvement technique for nanotechnology based circuits. SBCCI 2009

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