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"Performance and Impact of Process Variations in Tunnel-FET Ultra-Low ..."

Massimo Alioto, David Esseni (2014)

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DOI: 10.1145/2660540.2661000

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Massimo Alioto, David Esseni:
Performance and Impact of Process Variations in Tunnel-FET Ultra-Low Voltage Digital Circuits. SBCCI 2014: 32:1-32:6

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