"2011 IEEE Sixth International Workshop on Systematic Approaches to Digital ..."

Robert F. Erbacher, Roy H. Campbell, Yong Guan (2011)

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type: Editorship

metadata version: 2019-10-16

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Robert F. Erbacher, Roy H. Campbell, Yong Guan:
2011 IEEE Sixth International Workshop on Systematic Approaches to Digital Forensic Engineering, SADFE 2011, Oakland, CA, USA, May 26, 2011. IEEE Computer Society 2011, ISBN 978-1-4673-1242-4 [contents]

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