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"A Demultiplexer Immune from Fabrication-Error Impairments as an Enabler of ..."

Tomoyuki Akiyama et al. (2019)

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DOI: 10.23919/PS.2019.8817675

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Tomoyuki Akiyama, Shoichiro Oda, Seok-Hwan Jeong, Yasuhiro Nakasha, Yu Tanaka, Takeshi Hoshida:
A Demultiplexer Immune from Fabrication-Error Impairments as an Enabler of Compact High-Channel-Count (> 64 ch) Dense WDM Systems on Low-End Si PIC Platforms. OECC/PSC 2019: 1-3

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