"Defect, defect, defect: defect prediction 2.0."

Sunghun Kim (2012)

> Home

Details and statistics

DOI: 10.1145/2365324.2365325

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/promise/Kim12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/promise/Kim12
Sunghun Kim:
Defect, defect, defect: defect prediction 2.0. PROMISE 2012: 1-2

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.